Invention Grant
- Patent Title: Photoresist system and method
- Patent Title (中): 光刻胶系统和方法
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Application No.: US13829301Application Date: 2013-03-14
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Publication No.: US08932799B2Publication Date: 2015-01-13
- Inventor: Chen-Hau Wu , Ching-Yu Chang
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: G03C1/00
- IPC: G03C1/00 ; G03F7/00 ; H01L21/00 ; H01L21/027 ; G03F7/038 ; H01L21/308

Abstract:
A system and method for photoresists is provided. In an embodiment a cross-linking or coupling reagent is included within a photoresist composition. The cross-linking or coupling reagent will react with the polymer resin within the photoresist composition to cross-link or couple the polymers together, resulting in a polymer with a larger molecular weight. This larger molecular weight will cause the dissolution rate of the photoresist to decrease, leading to a better depth of focus for the line.
Public/Granted literature
- US20140273521A1 PHOTORESIST SYSTEM AND METHOD Public/Granted day:2014-09-18
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