Invention Grant
- Patent Title: Method and device for measurement with an IR imaging device
- Patent Title (中): 用IR成像装置进行测量的方法和装置
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Application No.: US13525024Application Date: 2012-06-15
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Publication No.: US08933403B2Publication Date: 2015-01-13
- Inventor: Emmanuel Vanneau
- Applicant: Emmanuel Vanneau
- Applicant Address: SE Taby
- Assignee: FLIR Systems AB
- Current Assignee: FLIR Systems AB
- Current Assignee Address: SE Taby
- Agency: Haynes and Boone, LLP
- Priority: EP11170287 20110617
- Main IPC: G01J5/02
- IPC: G01J5/02 ; G01J5/00
Abstract:
The present invention relates to a method and device for measuring at least two properties of an object, for some embodiments, said device comprising a measuring device for measuring at least one physical property of an object and an infrared imaging device for measuring at least one thermal property of an object, and wherein said first measuring device and said infrared imaging device are arranged to be synchronized to perform simultaneous measurements of the object.
Public/Granted literature
- US20120318984A1 METHOD AND DEVICE FOR MEASUREMENT WITH AN IR IMAGING DEVICE Public/Granted day:2012-12-20
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