Invention Grant
US08933504B2 Semiconductor structure and method for forming the semiconductor structure
有权
用于形成半导体结构的半导体结构和方法
- Patent Title: Semiconductor structure and method for forming the semiconductor structure
- Patent Title (中): 用于形成半导体结构的半导体结构和方法
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Application No.: US13807010Application Date: 2011-11-30
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Publication No.: US08933504B2Publication Date: 2015-01-13
- Inventor: Qingqing Liang , Huicai Zhong , Huilong Zhu
- Applicant: Qingqing Liang , Huicai Zhong , Huilong Zhu
- Agency: Treasure IP Group
- Priority: CN201110314174 20111017
- International Application: PCT/CN2011/001997 WO 20111130
- International Announcement: WO2013/056405 WO 20130425
- Main IPC: H01L29/78
- IPC: H01L29/78 ; H01L21/265 ; H01L29/66 ; H01L29/45 ; H01L29/49 ; H01L29/786 ; H01L21/822 ; H01L21/84 ; H01L27/06 ; H01L27/12 ; H01L27/115 ; H01L21/28

Abstract:
The invention discloses a semiconductor structure comprising: a substrate, a conductor layer, and a dielectric layer surrounding the conductor layer on the substrate; a first insulating layer covering both of the conductor layer and the dielectric layer; a gate conductor layer formed on the first insulating layer, and a dielectric layer surrounding the gate conductor layer; and a second insulating layer covering both of the gate conductor layer and the dielectric layer surrounding the gate conductor layer; wherein a through hole filled with a semiconductor material penetrates through the gate conductor layer perpendicularly, the bottom of the through hole stops on the conductor layer, and a first conductor plug serving as a drain/source electrode is provided on the top of the through hole; and a second conductor plug serving as a source/drain electrode electrically contacts the conductor layer, and a third conductor plug serving as a gate electrode electrically contacts the gate conductor layer.
Public/Granted literature
- US20130140624A1 Semiconductor Structure and Method for Forming The Semiconductor Structure Public/Granted day:2013-06-06
Information query
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