Invention Grant
- Patent Title: Capacitive sensor radiation measurement
- Patent Title (中): 电容式传感器辐射测量
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Application No.: US13228215Application Date: 2011-09-08
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Publication No.: US08933711B2Publication Date: 2015-01-13
- Inventor: Mark D. Hall , Mehul D. Shroff
- Applicant: Mark D. Hall , Mehul D. Shroff
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent David G. Dolezal; Jonathan N. Geld
- Main IPC: G01R27/26
- IPC: G01R27/26 ; G01T1/29

Abstract:
A system that includes at least one capacitive sensor for least one angle of incidence component of radiation being measured striking the sensor. The measured capacitance of the sensor is affected by radiation striking the sensor. In some embodiments, the system includes multiple sensors where differences in the capacitive measurements of the sensors can be used to determine information about the radiation such as e.g. horizontal angle, directional angle, and dose.
Public/Granted literature
- US20130063164A1 CAPACITIVE SENSOR RADIATION MEASUREMENT Public/Granted day:2013-03-14
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