Invention Grant
- Patent Title: Test apparatus and testing method
- Patent Title (中): 测试仪器和测试方法
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Application No.: US13062937Application Date: 2009-09-03
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Publication No.: US08933716B2Publication Date: 2015-01-13
- Inventor: Masahiro Ishida , Toshiyuki Okayasu , Kazuhiro Yamamoto
- Applicant: Masahiro Ishida , Toshiyuki Okayasu , Kazuhiro Yamamoto
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Ladas & Parry, LLP
- Priority: WOPCT/JP2008/002509 20080910
- International Application: PCT/JP2009/004357 WO 20090903
- International Announcement: WO2010/029709 WO 20100318
- Main IPC: G11C29/56
- IPC: G11C29/56 ; G01R31/317 ; G11C29/12

Abstract:
A main power supply supplies a power supply voltage to a power supply terminal of a DUT. A control pattern generator generates a control pattern including a pulse sequence. A compensation circuit intermittently injects a compensation current to the power supply terminal of the DUT via a path different from that of the main power supply. A switch is arranged between an output terminal of a voltage source and the power supply terminal of the DUT, and is turned on and off according to the control pattern.
Public/Granted literature
- US20110181308A1 TEST APPARATUS AND TESTING METHOD Public/Granted day:2011-07-28
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