Invention Grant
US08933716B2 Test apparatus and testing method 有权
测试仪器和测试方法

Test apparatus and testing method
Abstract:
A main power supply supplies a power supply voltage to a power supply terminal of a DUT. A control pattern generator generates a control pattern including a pulse sequence. A compensation circuit intermittently injects a compensation current to the power supply terminal of the DUT via a path different from that of the main power supply. A switch is arranged between an output terminal of a voltage source and the power supply terminal of the DUT, and is turned on and off according to the control pattern.
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