Invention Grant
- Patent Title: Memory and sense parameter determination methods
- Patent Title (中): 记忆和感测参数确定方法
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Application No.: US13413130Application Date: 2012-03-06
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Publication No.: US08934306B2Publication Date: 2015-01-13
- Inventor: Zhenlei Shen , William H. Radke
- Applicant: Zhenlei Shen , William H. Radke
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Dicke, Billig & Czaja, PLLC
- Main IPC: G11C7/06
- IPC: G11C7/06 ; G11C11/34 ; G11C7/10
Abstract:
Memory devices and methods for operating a memory include filtering a histogram of sensed data of the memory, and adjusting a parameter used to sense the memory using the filtered histogram. Filtering can be accomplished by averaging or summing, and may include weighting the sums or averages.
Public/Granted literature
- US20130238863A1 MEMORY AND SENSE PARAMETER DETERMINATION METHODS Public/Granted day:2013-09-12
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