Invention Grant
- Patent Title: Accurate determination of particle positioned on free surface in particle method
- Patent Title (中): 准确测定颗粒中位于自由表面的颗粒
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Application No.: US13593586Application Date: 2012-08-24
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Publication No.: US08935135B2Publication Date: 2015-01-13
- Inventor: Tatsuya Ishikawa
- Applicant: Tatsuya Ishikawa
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Cantor Colburn LLP
- Priority: JP2011-018125 20110131
- Main IPC: G06F7/60
- IPC: G06F7/60 ; G06F17/10 ; G06F17/50

Abstract:
Methods, an apparatus, and a computer program product for determining whether or not a particle belongs to free surface particles, in a calculation process of a particle method in which a continuum subjected to calculation analysis is collectively modeled with a free surface by a plurality of particles. One of the methods includes the steps of: determining whether any other particle exists within a predetermined range with respect to the particle by referencing to identification information stored in a memory, where the other particle belongs to the free surface, and storing in the memory near free surface identification information which is set as near free surface if the other particle belonging to the free surface exists and set as sufficiently inside if the other free surface particle belonging to the free surface does not exist.
Public/Granted literature
- US20130054206A1 ACCURATE DETERMINATION OF PARTICLE POSITIONED ON FREE SURFACE IN PARTICLE METHOD Public/Granted day:2013-02-28
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