Invention Grant
- Patent Title: System and method for examining concurrent system states
- Patent Title (中): 用于检查并发系统状态的系统和方法
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Application No.: US13458188Application Date: 2012-04-27
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Publication No.: US08935144B2Publication Date: 2015-01-13
- Inventor: Kamara Akili Benjamin , Guy-Vincent Jourdan , Iosif Viorel Onut , Gregor von Bochmann
- Applicant: Kamara Akili Benjamin , Guy-Vincent Jourdan , Iosif Viorel Onut , Gregor von Bochmann
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Holland & Knight LLP
- Agent Brian J. Colandreo, Esq.; Jeffrey T. Placker, Esq.
- Priority: CA2738422 20110428
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F9/44 ; G06F15/173

Abstract:
A computer-implemented process, computer program product, and apparatus for examining concurrent system state space models. A system has concurrent events to create a modeled system. A minimal chain decomposition of the modeled system is created to identify a set of chains. All chains in the set of chains are extended, and a first set of paths is generated, wherein the first set of paths is a minimal set of paths covering all states of the modeled system. The first set of paths is explored. It is optionally determined whether all transitions have been covered. Responsive to a determination that all transitions have not been covered, remaining paths are explored by traversing a graph induced by the modeled system using a depth-first strategy.
Public/Granted literature
- US20120278059A1 SYSTEM AND METHOD FOR EXAMINING CONCURRENT SYSTEM STATES Public/Granted day:2012-11-01
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