Invention Grant
- Patent Title: Test data generation
- Patent Title (中): 测试数据生成
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Application No.: US13428801Application Date: 2012-03-23
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Publication No.: US08935575B2Publication Date: 2015-01-13
- Inventor: Nikhil Girish Patwardhan , Ashim Roy , Moksha Suryakant Jivane , Varsha Jagtap , Eeti Sancheti , Nandita Babu
- Applicant: Nikhil Girish Patwardhan , Ashim Roy , Moksha Suryakant Jivane , Varsha Jagtap , Eeti Sancheti , Nandita Babu
- Applicant Address: IN Mumbai
- Assignee: Tata Consultancy Services Limited
- Current Assignee: Tata Consultancy Services Limited
- Current Assignee Address: IN Mumbai
- Agency: Barnes & Thornburg LLP
- Priority: IN3348/MUM/2011 20111128
- Main IPC: G06F11/36
- IPC: G06F11/36

Abstract:
Systems and methods for test data generation are described. In one implementation, the method includes receiving seed data having one or more characteristics. Further, the method includes obtaining a selection criterion indicating a selected portion of the seed data to be transformed. Based on the selection criterion, the seed data is transformed for at least a plurality of iterations to generate test data. The test data comprise a plurality of data sets including a primary data set generated in a first iteration and a secondary data set generated in each subsequent iteration. The primary data set includes transformed data corresponding to the selected portion of the seed data and non-transformed data corresponding to a remaining portion of the seed data and each secondary data set includes transformed data corresponding to the selected portion of the seed data.
Public/Granted literature
- US20130139003A1 Test Data Generation Public/Granted day:2013-05-30
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