Invention Grant
- Patent Title: Complex index refraction tomography with sub λ/6-resolution
- Patent Title (中): 具有亚λ/ 6分辨率的复折射折射断层扫描
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Application No.: US13637928Application Date: 2011-03-28
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Publication No.: US08937722B2Publication Date: 2015-01-20
- Inventor: Yann Cotte , Nicolas Pavillon , Christian Depeursinge
- Applicant: Yann Cotte , Nicolas Pavillon , Christian Depeursinge
- Applicant Address: CH Lausanne
- Assignee: Ecole Polytechnique Federale de Lausanne (EPFL)
- Current Assignee: Ecole Polytechnique Federale de Lausanne (EPFL)
- Current Assignee Address: CH Lausanne
- Agency: Nixon & Vanderhye P.C.
- Priority: WOPCT/IB2010/051345 20100328
- International Application: PCT/IB2011/051306 WO 20110328
- International Announcement: WO2011/121523 WO 20111006
- Main IPC: G01B9/021
- IPC: G01B9/021 ; G02B21/00 ; G02B21/36
Abstract:
A method for imaging a microscopic object with improved resolution including the steps of measuring a complex wavefield scattered by the microscopic object with an instrument or microscope, the complex wavefield being represented by phase and amplitude or by real and imaginary parts; and computing an image of the microscopic object with a resolution better than given by the Abbe diffraction limit, including deconvolving the complex wavefield scattered by the microscopic object with a complex coherent transfer function (CTF) applied to the complex wavefield.
Public/Granted literature
- US20130057869A1 COMPLEX INDEX REFRACTION TOMOGRAPHY WITH SUB LAMBDA/6-RESOLUTION Public/Granted day:2013-03-07
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