Invention Grant
- Patent Title: Determining a next value of a system-simulation parameter in response to representations of plots having the parameter as a dimension
- Patent Title (中): 响应于具有参数作为维度的曲线的表示,确定系统仿真参数的下一个值
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Application No.: US13199039Application Date: 2011-08-16
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Publication No.: US08938374B2Publication Date: 2015-01-20
- Inventor: Michael H. Baym , Philip Andrew Eckhoff , Daniel Jay MacDonald , Nathan P. Myhrvold , Karima R. Nigmatulina , Charles Whitmer , Lowell L. Wood, Jr.
- Applicant: Michael H. Baym , Philip Andrew Eckhoff , Daniel Jay MacDonald , Nathan P. Myhrvold , Karima R. Nigmatulina , Charles Whitmer , Lowell L. Wood, Jr.
- Applicant Address: US WA Bellevue
- Assignee: Tokitae LLC
- Current Assignee: Tokitae LLC
- Current Assignee Address: US WA Bellevue
- Agency: Lane Powell PC
- Agent Bryan A. Santarelli
- Main IPC: G06F17/50
- IPC: G06F17/50 ; G06F19/00

Abstract:
An embodiment of an apparatus includes a simulator, a generator, and a determiner. The simulator is configured to simulate a system and to propagate at least one state of the simulated system through time in response to a value of a parameter. The generator is configured to generate a representation of a region of a first plot having dimensions that respectively correspond at least to the parameter and to a characteristic of a state of the simulated system, and a representation of a region of a second plot having dimensions that respectively correspond at least to the parameter and to another characteristic of a state of the simulated system. And the determiner is configured to determine a next value of the parameter in response to the representations of the regions of the first and second plots.
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