Invention Grant
US08941387B2 Apparatus and method for fault detection and location determination
有权
用于故障检测和位置确定的装置和方法
- Patent Title: Apparatus and method for fault detection and location determination
- Patent Title (中): 用于故障检测和位置确定的装置和方法
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Application No.: US12902819Application Date: 2010-10-12
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Publication No.: US08941387B2Publication Date: 2015-01-27
- Inventor: Charles Kim
- Applicant: Charles Kim
- Applicant Address: US DC Washington US CA San Diego
- Assignee: Howard University,San Diego Gas & Electric Company
- Current Assignee: Howard University,San Diego Gas & Electric Company
- Current Assignee Address: US DC Washington US CA San Diego
- Agency: Fitch, Even, Tabin & Flanny LLP
- Main IPC: G01R31/08
- IPC: G01R31/08 ; G01R29/18

Abstract:
An electrical waveform is received over an electrical power line. A plurality of nominal electrical parameters are determined for the electrical power network and the plurality of nominal electrical parameters are associated with a state of the electrical power network in the absence of at least one transitory electrical fault in the network. Subsequently, a plurality of electrical parameters of the electrical waveform are sampled when the at least one transitory electrical fault exists in the network. A plurality of inductances are determined based at least in part upon a comparison of the nominal electrical parameters and the plurality of sampled electrical parameters. The plurality of inductances are representative of inductances present in the network when the at least one transitory electrical fault exists in the network. The plurality of inductances are analyzed to determine a distance and/or direction to the at least one electrical fault.
Public/Granted literature
- US20120086459A1 Apparatus and Method for Fault Detection and Location Determination Public/Granted day:2012-04-12
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