Invention Grant
- Patent Title: Spectral characteristic measurement method and spectral characteristic measurement apparatus that corrects for stray light
- Patent Title (中): 光谱特性测量方法和光谱特征测量装置,用于校正杂散光
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Application No.: US13397681Application Date: 2012-02-16
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Publication No.: US08941829B2Publication Date: 2015-01-27
- Inventor: Hiroyuki Sano , Kunikazu Taguchi
- Applicant: Hiroyuki Sano , Kunikazu Taguchi
- Applicant Address: JP Hirakata-Shi
- Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee Address: JP Hirakata-Shi
- Agency: Mori & Ward, LLP
- Priority: JP2011-053019 20110310
- Main IPC: G01J3/28
- IPC: G01J3/28 ; G01J3/02 ; G01J3/18

Abstract:
A spectral characteristic measurement method for measuring spectral characteristics of measured light with higher accuracy is provided. The spectral characteristic measurement method includes causing an optical measurement instrument having detection sensitivity in a first wavelength range to receive light in a second wavelength range which is a part of the first wavelength range, obtaining characteristic information indicating a stray light component from a portion of a first spectrum detected by the optical measurement instrument, that corresponds to a range other than the second wavelength range, and obtaining a pattern indicating a stray light component generated in the optical measurement instrument by subjecting the characteristic information to extrapolation processing as far as the second wavelength range in the first wavelength range.
Public/Granted literature
- US20120229803A1 SPECTRAL CHARACTERISTIC MEASUREMENT METHOD AND SPECTRAL CHARACTERISTIC MEASUREMENT APPARATUS Public/Granted day:2012-09-13
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