Invention Grant
US08942047B2 Bit line current trip point modulation for reading nonvolatile storage elements
有权
用于读取非易失性存储元件的位线电流跳变点调制
- Patent Title: Bit line current trip point modulation for reading nonvolatile storage elements
- Patent Title (中): 用于读取非易失性存储元件的位线电流跳变点调制
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Application No.: US14290891Application Date: 2014-05-29
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Publication No.: US08942047B2Publication Date: 2015-01-27
- Inventor: Man L. Mui , Teruhiko Kamei , Yingda Dong , Ken Oowada , Yosuke Kato , Fumitoshi Ito , Seungpil Lee
- Applicant: Sandisk Technologies Inc.
- Applicant Address: US TX Plano
- Assignee: Sandisk Technologies Inc.
- Current Assignee: Sandisk Technologies Inc.
- Current Assignee Address: US TX Plano
- Agency: Vierra Magen Marcus LLP
- Main IPC: G11C16/06
- IPC: G11C16/06 ; G11C16/28 ; G11C11/56 ; G11C16/26

Abstract:
Upon selecting non-volatile storage elements to be sensed, the system obtains information about the position of these non-volatile storage elements, determines sensing parameters based at least in part on this information, pre-charges a charge storage device and, while maintaining the voltage level of the bit lines of these memory cells at a constant value, applies a reference signal to these non-volatile storage elements for a certain duration of time, afterwards determining whether, for the certain duration of time, the current conducted by these non-volatile storage elements exceeds a predetermined value.
Public/Granted literature
- US20140269083A1 BIT LINE CURRENT TRIP POINT MODULATION FOR READING NONVOLATILE STORAGE ELEMENTS Public/Granted day:2014-09-18
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