Invention Grant
- Patent Title: Method for detection of specimen region, apparatus for detection of specimen region, and program for detection of specimen region
- Patent Title (中): 检测样本区域的方法，检测样本区域的装置以及检测区域的程序
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Application No.: US13303279Application Date: 2011-11-23
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Publication No.: US08942417B2Publication Date: 2015-01-27
- Inventor: Koichiro Kishima , Ryu Narusawa , Goh Matsunobu
- Applicant: Koichiro Kishima , Ryu Narusawa , Goh Matsunobu
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: Wolf, Greenfield & Sacks, P.C.
- Priority: JP2010-268442 20101201
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G02B21/36 ; G02B21/16 ; G06T7/00
Abstract:
A method for detecting the specimen region includes the first step for the first region detecting unit to detect the first region which is a region with contrast in the first image of an object for observation which is photographed under illumination with visible light, the second step for the second region detecting unit to detect the second region which is a region with contrast in the second image of the object for observation which is photographed under illumination with ultraviolet light, and the third step for the specimen region defining unit to define, based on the first and second regions mentioned above, the specimen region where there exists the specimen in the object for observation.
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