Invention Grant
US08942785B2 Selectable orientation bent tip calibration-free probe 有权
可选择方向弯曲尖端无校准探头

Selectable orientation bent tip calibration-free probe
Abstract:
A probe is provided. The probe may include a shaft portion rotatably attachable to a position sensing device, a nonlinear portion at least partially removed from a center axis of the shaft portion, and a tip disposed at a distal end of the nonlinear portion and positioned on the center axis. The nonlinear portion may be selectably rotatable about the center axis to one of a plurality of rotational orientations. The tip may have a substantially constant position relative to the position sensing device.
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