Invention Grant
- Patent Title: Selectable orientation bent tip calibration-free probe
- Patent Title (中): 可选择方向弯曲尖端无校准探头
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Application No.: US13313527Application Date: 2011-12-07
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Publication No.: US08942785B2Publication Date: 2015-01-27
- Inventor: Robert Van Vorhis
- Applicant: Robert Van Vorhis
- Applicant Address: US FL Fort Lauderdale
- Assignee: Mako Surgical Corporation
- Current Assignee: Mako Surgical Corporation
- Current Assignee Address: US FL Fort Lauderdale
- Agency: Miller, Matthias & Hull LLP
- Main IPC: A61B5/107
- IPC: A61B5/107

Abstract:
A probe is provided. The probe may include a shaft portion rotatably attachable to a position sensing device, a nonlinear portion at least partially removed from a center axis of the shaft portion, and a tip disposed at a distal end of the nonlinear portion and positioned on the center axis. The nonlinear portion may be selectably rotatable about the center axis to one of a plurality of rotational orientations. The tip may have a substantially constant position relative to the position sensing device.
Public/Granted literature
- US20130150708A1 Selectable Orientation Bent Tip Calibration-Free Probe Public/Granted day:2013-06-13
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