Invention Grant
- Patent Title: Soft field tomography system and method
- Patent Title (中): 软磁场断层扫描系统及方法
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Application No.: US13316514Application Date: 2011-12-11
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Publication No.: US08942787B2Publication Date: 2015-01-27
- Inventor: Wei Tan , Alexander Seth Ross , Veera Venkata Lakshmi Rajesh Langoju , Ran Niu , Zhilin Wu , Weihua Gao
- Applicant: Wei Tan , Alexander Seth Ross , Veera Venkata Lakshmi Rajesh Langoju , Ran Niu , Zhilin Wu , Weihua Gao
- Applicant Address: US NY Schenectady
- Assignee: General Electric Company
- Current Assignee: General Electric Company
- Current Assignee Address: US NY Schenectady
- Agency: GE Global Patent Operation
- Agent Marc A. Vivenzio
- Priority: CN201010612087 20101229
- Main IPC: A61B5/05
- IPC: A61B5/05

Abstract:
An iteration method for computing a distribution of one or more properties within an object comprises defining a first mesh of the object, applying an excitation to the object, computing a response of the object to the applied excitation, obtaining a reference response of the object corresponding to the applied excitation, computing a distribution of one or more properties of the object, and updating at least a subset of the nodes of the first mesh to form an updated mesh of the object. The distribution of one or more properties of the object is computed using the computed response, the reference response, and the first mesh. The first mesh includes a plurality of nodes and elements. A connectivity relationship of the subset of the nodes in the updated mesh remains the same as in the first mesh.
Public/Granted literature
- US20120172719A1 SOFT FIELD TOMOGRAPHY SYSTEM AND METHOD Public/Granted day:2012-07-05
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