Invention Grant
- Patent Title: Device for internal flaw magnification during wire drawing
- Patent Title (中): 拉丝时内部缺陷放大装置
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Application No.: US12451589Application Date: 2007-05-21
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Publication No.: US08943681B2Publication Date: 2015-02-03
- Inventor: Jeff Parrell , Boleslaw Czabai , Youzhu Zhang , Seungok Hong , Michael Field
- Applicant: Jeff Parrell , Boleslaw Czabai , Youzhu Zhang , Seungok Hong , Michael Field
- Applicant Address: US NJ Carteret
- Assignee: Oxford Superconducting Technology
- Current Assignee: Oxford Superconducting Technology
- Current Assignee Address: US NJ Carteret
- Agency: Klauber & Jackson LLC
- International Application: PCT/US2007/012063 WO 20070521
- International Announcement: WO2008/143615 WO 20081127
- Main IPC: G01N3/20
- IPC: G01N3/20 ; B23P17/00

Abstract:
A device for use as an adjunct in assuring that a manufactured wire is substantially free of internal flaws. A plurality of successively adjacent wire bending stations are provided, where each station includes means for bending the wire into bending planes which are different for each of the stations. The wire is passed through the successive stations, whereby the different bending planes at each station subject the wire at each station to tensile bending strain at portions of the wire cross-section which are different for each station. As a result the probability is increased that a given internal flaw in the wire will be exposed to the tensile bending strain condition as the wire passes through the successive stations, increasing likelihood of breakage of the wire at the flaw or of flaw magnification to improve detection of the flaw during subsequent wire inspections.
Public/Granted literature
- US20100101076A1 DEVICE AND METHOD FOR INTERNAL FLAW MAGNIFICATION OR REMOVAL Public/Granted day:2010-04-29
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