Invention Grant
- Patent Title: Automatic analyzer
- Patent Title (中): 自动分析仪
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Application No.: US13264996Application Date: 2010-04-07
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Publication No.: US08943909B2Publication Date: 2015-02-03
- Inventor: Satoru Chida , Hirokazu Iwamatsu , Kano Shimizu , Kazuhiro Nakamura , Kiyotaka Umino
- Applicant: Satoru Chida , Hirokazu Iwamatsu , Kano Shimizu , Kazuhiro Nakamura , Kiyotaka Umino
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2009-101528 20090420
- International Application: PCT/JP2010/002526 WO 20100407
- International Announcement: WO2010/122718 WO 20101028
- Main IPC: G01N1/22
- IPC: G01N1/22 ; G01N35/02 ; G01N35/00 ; G01N35/04

Abstract:
The present invention provides an automatic analyzer, in which when a specimen that cannot be analyzed due to an abnormality or needs to be remeasured exists, the automatic analyzer can swiftly reload the specimen that cannot be analyzed due to the abnormality or needs to be remeasured without waiting for completion of a measurement of another specimen held by a rack holding the specimen that cannot be analyzed or needs to be remeasured. The automatic analyzer has means for storing information of a rack loaded in the analyzer and specimen information, displaying identification information of the rack loaded in the analyzer to a user, specifying a specimen that needs to be reanalyzed due to an abnormality or needs to be collected for a remeasurement, interrupting analysis of a specimen rack holding the specimen, and collecting the specimen rack. The automatic analyzer can collect and reload the specified specimen.
Public/Granted literature
- US20120036944A1 AUTOMATIC ANALYZER Public/Granted day:2012-02-16
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