Invention Grant
US08944332B2 Testing automatic data collection devices, such as barcode, RFID and/or magnetic stripe readers
有权
测试自动数据采集设备,如条形码,RFID和/或磁条读取器
- Patent Title: Testing automatic data collection devices, such as barcode, RFID and/or magnetic stripe readers
- Patent Title (中): 测试自动数据采集设备,如条形码,RFID和/或磁条读取器
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Application No.: US11833461Application Date: 2007-08-03
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Publication No.: US08944332B2Publication Date: 2015-02-03
- Inventor: Andrew C. Harding , Jeffrey K. Suhr , Nicholas P. Allen
- Applicant: Andrew C. Harding , Jeffrey K. Suhr , Nicholas P. Allen
- Applicant Address: US WA Everett
- Assignee: Intermec IP Corp.
- Current Assignee: Intermec IP Corp.
- Current Assignee Address: US WA Everett
- Agency: Additon, Higgins & Pendleton, P.A.
- Main IPC: G06K13/00
- IPC: G06K13/00 ; G06K7/00 ; G06K7/10 ; G06F11/22 ; G06F11/07

Abstract:
Automatic data collection devices such as barcode readers, RFID readers, magnetic stripe readers and the like may be tested using ADC device test executables, modules or processes stored at a variety of network locations. One or more sets of tests or work lists may be defined to facilitate testing. Tests may be identified by name and/or keyword. Keywords may be indicative one or more functionalities tested by the respective ADC device test module.
Public/Granted literature
- US20080029597A1 TESTING AUTOMATIC DATA COLLECTION DEVICES, SUCH AS BARCODE, RFID AND/OR MAGNETIC STRIPE READERS Public/Granted day:2008-02-07
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