Invention Grant
- Patent Title: Magnetic immunoassay system
- Patent Title (中): 磁免疫测定系统
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Application No.: US11715916Application Date: 2007-03-09
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Publication No.: US08945469B2Publication Date: 2015-02-03
- Inventor: Akira Tsukamoto , Kazuo Saitoh
- Applicant: Akira Tsukamoto , Kazuo Saitoh
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2006-063776 20060309
- Main IPC: G01N33/543
- IPC: G01N33/543

Abstract:
A magnetic immunoassay system with a mechanism for compensating the direct current residual magnetic field in the vicinity of the specimen measurement position, in a direction perpendicular to the magnetic marker direction of magnetization for the measurement target. This invention reduces the effects of the magnetic field emitted from the unbound magnetic marker due to the residual magnetic field in the specimen solution and detects with high sensitivity the signal of the bound target magnetic marker. The magnetic field at the measurement position is regulated so as to intersect the direction of magnetization of the magnetic marker for the measurement target, in order to make the magnetization direction of the magnetic marker that is unbound due to residual magnetism or remanence in the sample solution, intersect the magnetization direction of the magnetic marker for the measurement target. The signal of the bound target magnetic marker can be therefore measured with high sensitivity since it is isolated from the unbound magnetic marker signal.
Public/Granted literature
- US20070254375A1 Magnetic immunoassay system Public/Granted day:2007-11-01
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