Invention Grant
- Patent Title: Sample analyzer and sample analyzing method
- Patent Title (中): 样品分析仪和样品分析方法
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Application No.: US12751284Application Date: 2010-03-31
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Publication No.: US08945470B2Publication Date: 2015-02-03
- Inventor: Keisuke Kuwano , Daigo Fukuma
- Applicant: Keisuke Kuwano , Daigo Fukuma
- Applicant Address: JP Kobe-Shi
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe-Shi
- Agency: Sughrue Mion, PLLC
- Priority: JP2009-088109 20090331; JP2009-279819 20091209
- Main IPC: G01N31/00
- IPC: G01N31/00 ; G01N33/00 ; C12M1/34 ; G01N35/04 ; G01N35/02 ; G01N35/00 ; C12Q1/02 ; C12M3/00 ; G01N35/10

Abstract:
The present invention is to present a sample analyzer comprising: a first measurement unit; a second measurement unit; a transport unit for transporting a sample container to the first measurement unit and the second measurement unit; and a controller configured to perform operations comprising: obtaining measurement item information indicating a measurement item of the sample contained in the sample container; and controlling the transport unit so as to transport the sample container to the second measurement unit when a first measurement item and a second measurement item different from the first measurement item are indicated in the measurement item information, and controlling the transport unit so as to transport the sample container to the first measurement unit or the second measurement unit when the first measurement item is indicated and the second measurement item is not indicated in the measurement item information.
Public/Granted literature
- US20100248293A1 SAMPLE ANALYZER AND SAMPLE ANALYZING METHOD Public/Granted day:2010-09-30
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