Invention Grant
- Patent Title: Method and kits to detect beryllium by fluorescence
- Patent Title (中): 通过荧光检测铍的方法和试剂盒
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Application No.: US11152620Application Date: 2005-06-14
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Publication No.: US08945931B2Publication Date: 2015-02-03
- Inventor: Anoop Agrawal , John P. Cronin , Alan G. Goodyear , Juan Carlos Lopez Tonazzi
- Applicant: Anoop Agrawal , John P. Cronin , Alan G. Goodyear , Juan Carlos Lopez Tonazzi
- Applicant Address: US AZ Tucson
- Assignee: Berylliant, Inc.
- Current Assignee: Berylliant, Inc.
- Current Assignee Address: US AZ Tucson
- Main IPC: G01N33/20
- IPC: G01N33/20 ; G01N21/64 ; G01N21/94 ; G01N21/77

Abstract:
A low-cost practical method of determining beryllium or a beryllium compound thereof in a sample is disclosed by measuring fluorescence. This method discloses optical filters for use with low cost fluorometers which may be used to quantitatively determine the presence of beryllium. This method may be extended to estimate particle size distribution for particles comprising Beryllium. A method is also disclosed to store solutions for extended period of time so that these materials are stable during transportation and in the labs.
Public/Granted literature
- US20050280816A1 Method and kits to detect beryllium by fluorescence Public/Granted day:2005-12-22
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