Invention Grant
US08945937B2 Apparatus and method for analyzing graphene and graphene boundary
有权
用于分析石墨烯和石墨烯边界的装置和方法
- Patent Title: Apparatus and method for analyzing graphene and graphene boundary
- Patent Title (中): 用于分析石墨烯和石墨烯边界的装置和方法
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Application No.: US13904526Application Date: 2013-05-29
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Publication No.: US08945937B2Publication Date: 2015-02-03
- Inventor: Young-hee Lee , Gang-hee Han , Dinh Loc Duong
- Applicant: Samsung Electronics Co., Ltd.
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Priority: KR10-2012-0066320 20120620
- Main IPC: G01N21/17
- IPC: G01N21/17 ; C01B31/04 ; G01B11/24
Abstract:
A method of analyzing graphene includes providing a first graphene structure including graphene having grains and grain boundaries, and a support portion for supporting the graphene, generating a second graphene structure by oxidizing the first graphene structure, and detecting a shape of the graphene.
Public/Granted literature
- US20130344611A1 APPARATUS AND METHOD FOR ANALYZING GRAPHENE AND GRAPHENE BOUNDARY Public/Granted day:2013-12-26
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