Invention Grant
- Patent Title: Methods for producing a tunnel field-effect transistor
- Patent Title (中): 隧道场效应晶体管的制造方法
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Application No.: US13957277Application Date: 2013-08-01
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Publication No.: US08946037B2Publication Date: 2015-02-03
- Inventor: Ronald Kakoschke , Helmut Tews
- Applicant: Infineon Technologies AG
- Applicant Address: DE Neubiberg
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE Neubiberg
- Agency: Slater & Matsil, L.L.P.
- Priority: DE102005002739 20050120
- Main IPC: H01L21/336
- IPC: H01L21/336 ; H01L29/66 ; H01L29/73 ; H01L21/28 ; H01L21/8234 ; H01L27/088 ; H01L29/78

Abstract:
A method for producing a tunnel field-effect transistor is disclosed. Connection regions of different doping types are produced by means of self-aligning implantation methods.
Public/Granted literature
- US20140024193A1 Methods for Producing a Tunnel Field-Effect Transistor Public/Granted day:2014-01-23
Information query
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