Invention Grant
- Patent Title: Epitaxial substrate for electronic device comprising a high resistance single crystal substrate on a low resistance single crystal substrate, and method of manufacturing
- Patent Title (中): 包含低电阻单晶衬底上的高电阻单晶衬底的电子器件外延衬底及其制造方法
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Application No.: US13388804Application Date: 2010-08-02
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Publication No.: US08946863B2Publication Date: 2015-02-03
- Inventor: Tetsuya Ikuta , Daisuke Hino , Ryo Sakamoto , Tomohiko Shibata
- Applicant: Tetsuya Ikuta , Daisuke Hino , Ryo Sakamoto , Tomohiko Shibata
- Applicant Address: JP Tokyo
- Assignee: Dowa Electronics Materials Co., Ltd.
- Current Assignee: Dowa Electronics Materials Co., Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Oliff PLC
- Priority: JP2009-181669 20090804
- International Application: PCT/JP2010/004871 WO 20100802
- International Announcement: WO2011/016219 WO 20110210
- Main IPC: H01L29/66
- IPC: H01L29/66 ; H01L29/778 ; H01L21/18 ; H01L29/812 ; H01L21/02

Abstract:
An epitaxial substrate for electronic devices, in which current flows in a lateral direction and of which warpage configuration is properly controlled, and a method of producing the same. The epitaxial substrate for electronic devices is produced by forming a bonded substrate by bonding a low-resistance Si single crystal substrate and a high-resistance Si single crystal substrate together; forming a buffer as an insulating layer on a surface of the bonded substrate on the high-resistance Si single crystal substrate side; and producing an epitaxial substrate by epitaxially growing a plurality of III-nitride layers on the buffer to form a main laminate. The resistivity of the low-resistance Si single crystal substrate is 100 Ω·cm or less, and the resistivity of the high-resistance Si single crystal substrate is 1000 Ω·cm or more.
Public/Granted literature
- US20120153440A1 EPITAXIAL SUBSTRATE FOR ELECTRONIC DEVICE AND METHOD OF PRODUCING THE SAME Public/Granted day:2012-06-21
Information query
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