Invention Grant
- Patent Title: Redistribution structures for microfeature workpieces
- Patent Title (中): 微型工件的再分配结构
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Application No.: US11846460Application Date: 2007-08-28
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Publication No.: US08946873B2Publication Date: 2015-02-03
- Inventor: Mark S. Johnson
- Applicant: Mark S. Johnson
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Perkins Coie LLP
- Main IPC: H01L23/552
- IPC: H01L23/552 ; H01L23/522 ; H01L23/31

Abstract:
Microfeature dies with redistribution structures that reduce or eliminate line interference are disclosed. The microfeature dies can include a substrate having a bond site and integrated circuitry electrically connected to the bond site. The microfeature dies can also include and a redistribution structure coupled to the substrate. The redistribution structure can include an external contact site configured to receive an electric coupler, a conductive line that is electrically connected to the external contact site and the bond site, and a conductive shield that at least partially surrounds the conductive line.
Public/Granted literature
- US20090057848A1 REDISTRIBUTION STRUCTURES FOR MICROFEATURE WORKPIECES Public/Granted day:2009-03-05
Information query
IPC分类: