Invention Grant
US08947070B2 Apparatus and method for testing driver writeability strength on an integrated circuit
有权
在集成电路上测试驱动器可写性强度的装置和方法
- Patent Title: Apparatus and method for testing driver writeability strength on an integrated circuit
- Patent Title (中): 在集成电路上测试驱动器可写性强度的装置和方法
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Application No.: US13351313Application Date: 2012-01-17
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Publication No.: US08947070B2Publication Date: 2015-02-03
- Inventor: Ashish R. Jain , Edgardo F. Klass
- Applicant: Ashish R. Jain , Edgardo F. Klass
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
- Agent Stephen J. Curran
- Main IPC: G11C8/00
- IPC: G11C8/00 ; G01R31/3185 ; G01R31/319

Abstract:
An apparatus and method for testing driver write-ability strength on an integrated circuit includes one or more drive detection units each including a number of drivers. At least some of the drivers may have a different drive strength and each may drive a voltage onto a respective driver output line. Each drive detection unit may include a number of keeper circuits, each coupled to a separate output line and configured to retain a given voltage on the output line to which it is coupled. Each detection unit may also include a number of detection circuits coupled to detect the drive voltage on each of the output lines. In one implementation, the drive voltage appearing at the output line of each driver may be indicative of that the driver was able to overdrive the voltage being retained on the output line to which it is coupled by the respective keeper circuits.
Public/Granted literature
- US20120112736A1 APPARATUS AND METHOD FOR TESTING DRIVER WRITEABILITY STRENGTH ON AN INTEGRATED CIRCUIT Public/Granted day:2012-05-10
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