Invention Grant
- Patent Title: Switching apparatus and test apparatus
- Patent Title (中): 开关设备和测试仪器
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Application No.: US13118472Application Date: 2011-05-30
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Publication No.: US08947112B2Publication Date: 2015-02-03
- Inventor: Itaru Yamanobe
- Applicant: Itaru Yamanobe
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Priority: JP2008-334617 20081226
- Main IPC: G01R31/00
- IPC: G01R31/00 ; H02J4/00 ; H03K17/28 ; H02J1/00 ; G01R31/28

Abstract:
Provided is a switching apparatus that switches a connection state between two terminals, comprising a switch that switches the connection state between the two terminals according to a control voltage supplied thereto; a driving section that provides the switch with the control voltage corresponding to a control signal supplied thereto; and a changing section that changes the control voltage output from the driving section, according to a designated switching time. The changing section may change power supplied as a power supply to the driving section, according to the designated switching time. The changing section may change the control voltage output from the driving section prior to switching of the switch.
Public/Granted literature
- US20120139567A1 SWITCHING APPARATUS AND TEST APPARATUS Public/Granted day:2012-06-07
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