Invention Grant
US08947116B2 System for testing an integrated circuit of a device and its method of use
有权
用于测试设备集成电路的系统及其使用方法
- Patent Title: System for testing an integrated circuit of a device and its method of use
- Patent Title (中): 用于测试设备集成电路的系统及其使用方法
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Application No.: US13223319Application Date: 2011-09-01
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Publication No.: US08947116B2Publication Date: 2015-02-03
- Inventor: Scott E. Lindsey , Junyje Yeh , Jovan Jovanovic , Seang P. Malathong
- Applicant: Scott E. Lindsey , Junyje Yeh , Jovan Jovanovic , Seang P. Malathong
- Applicant Address: US CA Fremont
- Assignee: Aehr Test Systems
- Current Assignee: Aehr Test Systems
- Current Assignee Address: US CA Fremont
- Agent Stephen M. De Klerk
- Main IPC: G01R31/00
- IPC: G01R31/00 ; G01R31/28

Abstract:
A method of testing an integrated circuit of a device is described. Air is allowed through a fluid line to modify a size of a volume defined between the first and second components of an actuator to move a contactor support structure relative to the apparatus and urge terminals on the contactor support structure against contacts on the device. Air is automatically released from the fluid line through a pressure relief valve when a pressure of the air in the fluid line reaches a predetermined value. The holder is moved relative to the apparatus frame to disengage the terminals from the contacts while maintaining the first and second components of the actuator in a substantially stationary relationship with one another. A connecting arrangement is provided including first and second connecting pieces with complementary interengaging formations that restricts movement of the contactor substrate relative to the distribution board substrate in a tangential direction.
Public/Granted literature
- US20110316577A1 SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USE Public/Granted day:2011-12-29
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