Invention Grant
US08947236B2 Sensing properties of a material loading a UHF RFID tag by analysis of the complex reflection backscatter at different frequencies and power levels
有权
通过分析不同频率和功率水平的复反射反向散射，加载UHF RFID标签的材料的感应特性
- Patent Title: Sensing properties of a material loading a UHF RFID tag by analysis of the complex reflection backscatter at different frequencies and power levels
- Patent Title (中): 通过分析不同频率和功率水平的复反射反向散射，加载UHF RFID标签的材料的感应特性
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Application No.: US13008054Application Date: 2011-01-18
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Publication No.: US08947236B2Publication Date: 2015-02-03
- Inventor: Ian J. Forster
- Applicant: Ian J. Forster
- Applicant Address: US CA Glendale
- Assignee: Avery Dennison Corporation
- Current Assignee: Avery Dennison Corporation
- Current Assignee Address: US CA Glendale
- Agency: Avery Dennison Retail Information Services LLC
- Main IPC: G08B13/14
- IPC: G08B13/14 ; G08B1/08 ; H04Q5/22 ; H01Q1/50 ; H01Q1/36 ; G06K19/077
Abstract:
An RFID device for sensing the properties of a material in proximity to a UHF tag. The RFID device includes a microchip, an antenna operatively coupled to the microchip, and an impedance transforming section operatively coupled to the microchip and to the antenna. Changing an electrical characteristic of at least one component of the RFID device results in a complex reflected signal at a reader device representing a sensed state of a material in proximity to the RFID device.
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