Invention Grant
- Patent Title: Low clutter method for bistatic RCS measurements
- Patent Title (中): 双基RCS测量的低杂波方法
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Application No.: US13534080Application Date: 2012-06-27
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Publication No.: US08947295B2Publication Date: 2015-02-03
- Inventor: Peter J Collins
- Applicant: Peter J Collins
- Applicant Address: US DC Washington
- Assignee: The United States of America as represented by the Secretary of the Air Force
- Current Assignee: The United States of America as represented by the Secretary of the Air Force
- Current Assignee Address: US DC Washington
- Agency: AFMCLO/JAZ
- Agent Charles Figer, Jr.
- Main IPC: G01S7/41
- IPC: G01S7/41 ; G01S7/02 ; G01S7/00
Abstract:
A bistatic radar measurement system is provided having a radar source configured to produce a radio frequency signal. A transmitting antenna is configured to transmit the radio frequency signal toward a target. A receiving antenna is configured to receive a reflected radio frequency signal from the target. A support system is configured to support the receiving antenna. The support system includes a plurality of low scattering dielectric strings configured to orient the receiving antenna.
Public/Granted literature
- US20140002297A1 Low Clutter Method for Bistatic RCS Measurements Public/Granted day:2014-01-02
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