Invention Grant
- Patent Title: Lithographic apparatus, device manufacturing method, and substrate exchanging method
- Patent Title (中): 平版印刷设备,器件制造方法和衬底交换方法
-
Application No.: US13050667Application Date: 2011-03-17
-
Publication No.: US08947636B2Publication Date: 2015-02-03
- Inventor: Theodorus Petrus Maria Cadee , Jan Jaap Kuit , Johannes Catharinus Hubertus Mulkens , Koen Jacobus Johannes Maria Zaal
- Applicant: Theodorus Petrus Maria Cadee , Jan Jaap Kuit , Johannes Catharinus Hubertus Mulkens , Koen Jacobus Johannes Maria Zaal
- Applicant Address: NL Veldhoven
- Assignee: ASML Netherlands B.V.
- Current Assignee: ASML Netherlands B.V.
- Current Assignee Address: NL Veldhoven
- Agency: Pillsbury Winthrop Shaw Pittman LLP
- Main IPC: G03B27/58
- IPC: G03B27/58 ; G03B21/58 ; G03F7/20

Abstract:
A lithographic apparatus includes an illumination system configured to condition a radiation beam; a support constructed to support a patterning device, the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam; at least three substrate tables that are each constructed to hold a substrate; and a projection system configured to project the patterned radiation beam onto a target portion of the substrate, wherein the substrate tables are moveable in a common moving area extending substantially in a plane perpendicular to the patterned radiation beam, the moving area comprising at least three working locations of which at least one working location is arranged for exposure of the substrate to the patterned radiation beam and at least one working location is arranged for non-exposure purposes.
Public/Granted literature
- US20110242518A1 LITHOGRAPHIC APPARATUS, DEVICE MANUFACTURING METHOD, AND SUBSTRATE EXCHANGING METHOD Public/Granted day:2011-10-06
Information query