Invention Grant
- Patent Title: Refractive index measuring device and refractive index measuring method
- Patent Title (中): 折射率测量装置和折射率测量方法
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Application No.: US13823144Application Date: 2011-09-09
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Publication No.: US08947650B2Publication Date: 2015-02-03
- Inventor: Hirotoshi Yasunaga , Koji Yamabuchi , Takeshi Ishida
- Applicant: Hirotoshi Yasunaga , Koji Yamabuchi , Takeshi Ishida
- Applicant Address: JP Osaka
- Assignee: Sharp Kabushiki Kaisha
- Current Assignee: Sharp Kabushiki Kaisha
- Current Assignee Address: JP Osaka
- Agency: Keating & Bennett, LLP
- Priority: JP2010-208125 20100916
- International Application: PCT/JP2011/070549 WO 20110909
- International Announcement: WO2012/036075 WO 20120322
- Main IPC: G01N21/41
- IPC: G01N21/41 ; G01N21/43

Abstract:
In a refractive index measuring device (1) for measuring a refractive index of a solid sample (S), the solid sample (S) is closely attached to a prism (3) having a predetermined refractive index with a refractive index liquid (4) having a predetermined refractive index interposed therebetween. A scaled angle (light receiving member) (6) having a light receiving surface (6a) that receives first reflected light (R1), which is a part of light from a light source (2) and which is reflected by the prism (3), is provided. When the prism (3) is rotationally driven by a rotary table (rotational drive unit) (5) and an intensity of second reflected light (R2) detected by a detector (7) becomes lower than a predetermined value, the refractive index of the solid sample (S) is measured by using a position of the first reflected light (R1) on the light receiving surface (6a) of the scaled angle (6).
Public/Granted literature
- US20130182245A1 REFRACTIVE INDEX MEASURING DEVICE AND REFRACTIVE INDEX MEASURING METHOD Public/Granted day:2013-07-18
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