Invention Grant
US08947835B2 Tunneling magnetoresistance (TMR) read sensor with a long diffusion path and ex-situ interfaces in a sense layer structure 有权
隧道磁阻(TMR)读取传感器具有漫长的扩散路径和异常接口的感应层结构

  • Patent Title: Tunneling magnetoresistance (TMR) read sensor with a long diffusion path and ex-situ interfaces in a sense layer structure
  • Patent Title (中): 隧道磁阻(TMR)读取传感器具有漫长的扩散路径和异常接口的感应层结构
  • Application No.: US13335642
    Application Date: 2011-12-22
  • Publication No.: US08947835B2
    Publication Date: 2015-02-03
  • Inventor: Tsann Lin
  • Applicant: Tsann Lin
  • Applicant Address: NL Amsterdam
  • Assignee: HGST Netherlands B.V.
  • Current Assignee: HGST Netherlands B.V.
  • Current Assignee Address: NL Amsterdam
  • Agency: Zilka-Kotab, PC
  • Main IPC: G11B5/39
  • IPC: G11B5/39 G11B5/40
Tunneling magnetoresistance (TMR) read sensor with a long diffusion path and ex-situ interfaces in a sense layer structure
Abstract:
The invention provides a tunneling magnetoresistance (TMR) read sensor with a long diffusion path and ex-situ interfaces in a sense layer structure. The sense layer structure comprises a first sense layer preferably formed of a ferromagnetic Co—Fe film, a second sense layer preferably formed of a ferromagnetic Co—Fe—B film, and a third sense layer preferably formed of a ferromagnetic Ni—Fe film. The sense layer structure has a long diffusion path (defined as a total thickness of the first and second sense layers) and ex-situ interfaces for suppressing unwanted diffusions of Ni atoms. Alternatively, the sense layer structure comprises a first sense layer preferably formed of a ferromagnetic Co—Fe film, a second sense layer preferably formed of a ferromagnetic Co—Fe—B film, a third sense layer preferably formed of a ferromagnetic Co—Fe—B—Hf film, and a fourth sense layer preferably formed of a ferromagnetic Ni—Fe film.
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