Invention Grant
- Patent Title: Test device for buck circuit
- Patent Title (中): 降压电路测试装置
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Application No.: US13909114Application Date: 2013-06-04
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Publication No.: US08947836B2Publication Date: 2015-02-03
- Inventor: Song-Lin Tong
- Applicant: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd. , Hon Hai Precision Industry Co., Ltd.
- Applicant Address: CN Shenzhen TW New Taipei
- Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee: Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.,Hon Hai Precision Industry Co., Ltd.
- Current Assignee Address: CN Shenzhen TW New Taipei
- Agency: Novak Druce Connolly Bove + Quigg LLP
- Priority: CN2012102245165 20120702
- Main IPC: H02H7/00
- IPC: H02H7/00 ; H02H3/02 ; G01R31/40 ; G01R31/28 ; H02M1/32

Abstract:
A test device includes a transformer, a loop analyzer, and a protection circuit. The protection circuit includes a control unit, a signal acquisition and amplification unit, and an electronic switch. When the loop analyzer outputs a signal, the signal acquisition and amplification unit acquires the signal output from the loop analyzer, amplifies the acquired signal, and outputs the amplified signal to the control unit. The control unit transforms the received signal from analog form to digital form, and compares the digital signal with a reference value. If the digital signal is greater than the reference value, the control unit outputs a control signal to the electronic switch, to turn off the electronic switch. The signal output from the loop analyzer cannot be transmitted to a buck circuit.
Public/Granted literature
- US20140002938A1 TEST DEVICE FOR BUCK CIRCUIT Public/Granted day:2014-01-02
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