Invention Grant
US08947907B1 Current source circuits and methods for mass write and testing of programmable impedance elements 有权
用于大量写入和测试可编程阻抗元件的电流源电路和方法

Current source circuits and methods for mass write and testing of programmable impedance elements
Abstract:
An integrated circuit device can include a plurality of memory cells, each including at least one element programmable between different impedance states by application of a voltage or current; a plurality of bit line groups, each bit line group including multiple bit lines, each bit line being coupled to multiple memory cells; a plurality of current source circuits coupled to the bit line groups, each current source circuit configured to couple the bit lines of its respective group to at least a first bias node or a second bias node.
Information query
Patent Agency Ranking
0/0