Invention Grant
US08947907B1 Current source circuits and methods for mass write and testing of programmable impedance elements
有权
用于大量写入和测试可编程阻抗元件的电流源电路和方法
- Patent Title: Current source circuits and methods for mass write and testing of programmable impedance elements
- Patent Title (中): 用于大量写入和测试可编程阻抗元件的电流源电路和方法
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Application No.: US13862390Application Date: 2013-04-13
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Publication No.: US08947907B1Publication Date: 2015-02-03
- Inventor: Shane Charles Hollmer , John Dinh
- Applicant: Adesto Technologies Corporation
- Applicant Address: US CA Sunnyvale
- Assignee: Adesto Technologies Corporation
- Current Assignee: Adesto Technologies Corporation
- Current Assignee Address: US CA Sunnyvale
- Main IPC: G11C11/00
- IPC: G11C11/00 ; G11C7/00

Abstract:
An integrated circuit device can include a plurality of memory cells, each including at least one element programmable between different impedance states by application of a voltage or current; a plurality of bit line groups, each bit line group including multiple bit lines, each bit line being coupled to multiple memory cells; a plurality of current source circuits coupled to the bit line groups, each current source circuit configured to couple the bit lines of its respective group to at least a first bias node or a second bias node.
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