Invention Grant
- Patent Title: Load abnormality detection apparatus performing accurate judgment of cause of abnormality
- Patent Title (中): 负载异常检测装置执行异常原因的准确判断
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Application No.: US13230977Application Date: 2011-09-13
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Publication No.: US08948627B2Publication Date: 2015-02-03
- Inventor: Yuusuke Ishizaki
- Applicant: Yuusuke Ishizaki
- Applicant Address: JP Tokyo
- Assignee: Ricoh Company, Ltd.
- Current Assignee: Ricoh Company, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: IPUSA, PLLC
- Priority: JP2010-208585 20100916; JP2011-191401 20110902
- Main IPC: G03G15/00
- IPC: G03G15/00 ; H02P6/12 ; G03G15/16

Abstract:
A load abnormality detection apparatus detects a load abnormality in first and second rotational members acting on each other. An inclination calculation part calculates an inclination of a second control element. A first comparison part compares a first control element with a first threshold value and also with a second threshold value larger than the first threshold value. A second comparison part compares an inclination of change in the second control element with a third threshold value of a negative value and also with a fourth threshold value of a positive value. An abnormality detection part detects a load abnormality in a load applied to the first rotational member and the second rotational member based on results of comparison by the first comparison part and the second comparison part and identifies a cause of the detected load abnormality.
Public/Granted literature
- US20120070168A1 LOAD ABNORMALITY DETECTION APPARATUS PERFORMING ACCURATE JUDGMENT OF CAUSE OF ABNORMALITY Public/Granted day:2012-03-22
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