Invention Grant
- Patent Title: Inspection method
- Patent Title (中): 检验方法
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Application No.: US13295757Application Date: 2011-11-14
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Publication No.: US08949060B2Publication Date: 2015-02-03
- Inventor: Bong-Ha Hwang
- Applicant: Bong-Ha Hwang
- Applicant Address: KR Seoul
- Assignee: Koh Young Technology Inc.
- Current Assignee: Koh Young Technology Inc.
- Current Assignee Address: KR Seoul
- Agency: Kile Park Reed & Houtteman PLLC
- Main IPC: G01N21/88
- IPC: G01N21/88 ; G01N21/956 ; G06F17/40 ; G06F19/00

Abstract:
In order to set an inspection area in an inspection apparatus for inspecting a board, a plurality of measurement areas are set on a board, and then reference data and measurement data of at least one adjacent measurement area that is adjacent to a target measurement area for inspecting a measurement target, among the measurement areas, are acquired. Thereafter, at least one feature object is extracted from the adjacent measurement area. Then, a distortion degree is acquired by comparing reference data and measurement data corresponding to the feature object with each other, and thereafter the distortion degree is compensated for, to set an inspection area in the target measurement area. Thus, a conversion relation between the reference data and the measurement data may be correctly acquired, and an inspection area, in which distortion is compensated for, may be correctly set.
Public/Granted literature
- US20120123719A1 INSPECTION METHOD Public/Granted day:2012-05-17
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