Provided is a test module comprising a specified pattern detecting section that detects a specified pattern output in response to a specified test pattern from a device under test outputting output patterns in response to test patterns; a timing detecting section that detects a timing at which the specified pattern is detected; and a phase adjusting section that adjusts phases of the output patterns to match phases of expected value patterns, which are expected from the device under test as responses to the test patterns, based on the timing detected by the timing detecting section.