Invention Grant
- Patent Title: Method and device for the quality analysis of system models
- Patent Title (中): 系统模型质量分析方法和装置
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Application No.: US13296978Application Date: 2011-11-15
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Publication No.: US08949167B2Publication Date: 2015-02-03
- Inventor: Horst Eckardt , Sieglinde Kranz , Nikolaus Regnat
- Applicant: Horst Eckardt , Sieglinde Kranz , Nikolaus Regnat
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: King & Spalding L.L.P.
- Priority: DE102010044039 20101117
- Main IPC: G06N5/02
- IPC: G06N5/02 ; G06F9/44
Abstract:
A device (100) for the quality analysis of system models (10, 12) has a testing tool (1) that is designed to receive a plurality of system models (10, 12) from a plurality of modeling tools (11, 13), convert it into a unified data model (2) and check it for quality with the aid of unified quality rules (3).
Public/Granted literature
- US20120123990A1 Method And Device For The Quality Analysis Of System Models Public/Granted day:2012-05-17
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