Invention Grant
- Patent Title: Short beam shear test fixture
- Patent Title (中): 短梁剪切试验夹具
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Application No.: US13347488Application Date: 2012-01-10
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Publication No.: US08950270B2Publication Date: 2015-02-10
- Inventor: David L. Williams , Ron McCullough
- Applicant: David L. Williams , Ron McCullough
- Applicant Address: US RI Providence
- Assignee: Textron Innovatons Inc.
- Current Assignee: Textron Innovatons Inc.
- Current Assignee Address: US RI Providence
- Agent James E. Walton; Damon R. Hickman
- Main IPC: G01N3/02
- IPC: G01N3/02 ; G01N3/04 ; B23B31/16

Abstract:
The test fixture includes a housing, a first grip, and a second grip. The first grip and the second grip are each configured to clamp onto an upper surface and lower surface of a material coupon. The test fixture also includes an upper input jaw and a lower input jaw each configured to clamp onto the material coupon near a center of the upper surface and the lower surface of the material coupon. The test fixture is configured to load the material coupon in a first direction and a second direction. The first grip and the second grip are each configured to clamp onto the material coupon at a location which accordingly results in a desired testing ratio regardless of a variation in thickness of the material coupon.
Public/Granted literature
- US20120222491A1 Short Beam Shear Test Fixture Public/Granted day:2012-09-06
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