Invention Grant
- Patent Title: Formation of functional gate structures with different critical dimensions using a replacement gate process
- Patent Title (中): 使用替代栅极工艺形成具有不同临界尺寸的功能栅极结构
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Application No.: US14071984Application Date: 2013-11-05
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Publication No.: US08951868B1Publication Date: 2015-02-10
- Inventor: Sameer H. Jain
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Scully, Scott, Murphy & Presser, P.C.
- Agent H. Daniel Schnurmann
- Main IPC: H01L21/8234
- IPC: H01L21/8234 ; H01L29/66 ; H01L27/092

Abstract:
A plurality of sacrificial gate structures is formed on substrate. A first set of sacrificial gate structures of the plurality of sacrificial gate structures contains a sacrificial spacer on sidewall surfaces thereof, and a second set of sacrificial gate structures of the plurality of sacrificial gate structures has bare sidewall surfaces. A dielectric spacer is provided to the first and second sets of sacrificial gate structures. Each sacrificial gate structure of the first and second sets is removed together with the sacrificial spacers providing first gate cavities in the area previously occupied by a sacrificial gate structure of the first set of sacrificial gate structures and the sacrificial spacer and second gate cavities in the area previously occupied by a sacrificial gate structure of the second set of sacrificial gate structures. A functional gate is formed in each of the first and second gate cavities.
Information query
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