Invention Grant
- Patent Title: Power supply apparatus for testing apparatus
- Patent Title (中): 供电设备用于测试仪器
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Application No.: US13924480Application Date: 2013-06-21
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Publication No.: US08952671B2Publication Date: 2015-02-10
- Inventor: Takahiko Shimizu , Katsuhiko Degawa
- Applicant: Advantest Corporation
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Agency: Ladas & Parry, LLP
- Priority: JP2012-145859 20120628
- Main IPC: G05F1/40
- IPC: G05F1/40 ; G05F1/625 ; G05F1/575

Abstract:
A main reference value setting unit generates a voltage reference value DREF—V which represents a target level of a power supply voltage VDD. A digital calculation unit generates a main control value DOUT by digital calculation such that a digital voltage measurement value DM—V which represents the voltage level of the current power supply voltage VDD matches the voltage reference value DREF—V. A main D/A converter converts the main control value DOUT into an analog power supply signal SPS, and supplies the analog power supply signal SPS thus generated to a power supply terminal of a DUT via a power supply line. An auxiliary current source supplies an auxiliary current ISUB to the power supply terminal of the DUT via a sub-path that differs from the power supply line.
Public/Granted literature
- US20140009129A1 POWER SUPPLY APPARATUS FOR TESTING APPARATUS Public/Granted day:2014-01-09
Information query
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