Invention Grant
- Patent Title: System and method for examining asymetric operations
- Patent Title (中): 检查不对称操作的系统和方法
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Application No.: US13287053Application Date: 2011-11-01
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Publication No.: US08952705B2Publication Date: 2015-02-10
- Inventor: Ilyas Elkin , Wojciech Jakub Poppe
- Applicant: Ilyas Elkin , Wojciech Jakub Poppe
- Applicant Address: US CA Santa Clara
- Assignee: Nvidia Corporation
- Current Assignee: Nvidia Corporation
- Current Assignee Address: US CA Santa Clara
- Main IPC: G01R27/28
- IPC: G01R27/28 ; G01R31/30 ; G01R31/28

Abstract:
Systems and methods for transition delay measuring are presented. A transition delay measuring method can include oscillating a signal between states and tracking an indication associated with an isolated attribute of the transitions between the states. Oscillations can include asymmetric transitions between the states and the tracked isolated attribute can be a delay in completing transitions between the states in one direction or vice versa. The asymmetric transitions can include transitions between the first state and the second state that are faster than slower transitions between the second state and the first state or vice versa. The tracked indication can be utilized in analysis of the isolated transition delay characteristics. The results can be utilized in analysis of various further features and characteristics (e.g., examination of leakage current related power consumption, timing of asymmetric operation, etc.). The analysis can include examination of fabrication process and operating parameters.
Public/Granted literature
- US20130106438A1 SYSTEM AND METHOD FOR EXAMINING ASYMETRIC OPERATIONS Public/Granted day:2013-05-02
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