Invention Grant
- Patent Title: High-precision, compact altimetric measurement system
- Patent Title (中): 高精度，紧凑的高度测量系统
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Application No.: US13523325Application Date: 2012-06-14
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Publication No.: US08952842B2Publication Date: 2015-02-10
- Inventor: Richard Jacques , Nicolas Taveneau
- Applicant: Richard Jacques , Nicolas Taveneau
- Applicant Address: FR Neuilly sur Seine
- Assignee: Thales
- Current Assignee: Thales
- Current Assignee Address: FR Neuilly sur Seine
- Agency: Baker & Hostetler LLP
- Priority: FR1101859 20110617
- Main IPC: G01S13/08
- IPC: G01S13/08 ; G01S7/40 ; G01C5/00 ; G01J1/56 ; G01S13/86 ; G01S13/88 ; G01S13/00 ; G01S7/00
Abstract:
An altimetry system for a satellite, including an altimeter transmitting and receiving signals on at least one first frequency band; a radiometer receiving signals on at least one second frequency band, the altimeter and the radiometer being connected to one and the same antenna; reception means common to the altimeter and to the radiometer, and capable of amplifying and filtering the signals received from the antenna on a frequency band including the first frequency band and the second frequency band; means for separating the signals on the first frequency band from the signals on the second frequency band; the signals on the first frequency band being exploited to estimate an altimetric distance of the satellite, and radiometric measurements being exploited in order to correct the estimate.
Public/Granted literature
- US20130169472A1 HIGH-PRECISION, COMPACT ALTIMETRIC MEASUREMENT SYSTEM Public/Granted day:2013-07-04
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