Invention Grant
US08953030B1 System for viewing samples that are undergoing ellipsometric investigation in real time 有权
用于查看正在进行椭偏仪调查的样品的系统

System for viewing samples that are undergoing ellipsometric investigation in real time
Abstract:
In the context of an ellipsometer or the like, positioning a camera other than directly above a sample being investigated by an electromagnetic beam, while said camera provides an optical view of a surface of said sample which is in focus over the entire viewed extent of the sample.
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