Invention Grant
- Patent Title: Validation and correction of spectrometer performance using a validation cell
- Patent Title (中): 使用验证单元验证和校正光谱仪性能
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Application No.: US13027000Application Date: 2011-02-14
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Publication No.: US08953165B2Publication Date: 2015-02-10
- Inventor: Alfred Feitisch , Lutz Keller , Xiang Liu , Mathias Schrempel , Keith Benjamin Helbley
- Applicant: Alfred Feitisch , Lutz Keller , Xiang Liu , Mathias Schrempel , Keith Benjamin Helbley
- Applicant Address: US CA Rancho Cucamonga
- Assignee: SpectraSensors, Inc.
- Current Assignee: SpectraSensors, Inc.
- Current Assignee Address: US CA Rancho Cucamonga
- Agency: Mintz Levin Cohn Ferris Glovsky and Popeo, P.C.
- Main IPC: G01N21/27
- IPC: G01N21/27 ; G01J3/28 ; G01J3/42 ; G01N21/03 ; G01N21/31 ; G01N21/3504 ; G01N21/3518 ; G01N21/39

Abstract:
Light intensity data quantifying intensity of light generated by a light source and received at a detector during a validation mode of an absorption spectrometer can be compared with a stored data set representing at least one previous measurement in a validation mode of an analytical system. The validation mode can include causing the light to pass at least once through each of a zero gas and a reference gas contained within a validation cell and including a known amount of a target analyte. The zero gas can have at least one of known and negligible first light absorbance characteristics within a range of wavelengths produced by the light source. A validation failure can be determined to have occurred if the first light intensity data and the stored data set are out of agreement by more than a predefined threshold amount. Related systems, methods, and articles of manufacture are also described.
Public/Granted literature
- US20110299084A1 VALIDATION AND CORRECTION OF SPECTROMETER PERFORMANCE USING A VALIDATION CELL Public/Granted day:2011-12-08
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