Invention Grant
US08953175B2 Mark position detector, imprint apparatus, and article manufacturing method
有权
标记位置检测器,压印装置和制品制造方法
- Patent Title: Mark position detector, imprint apparatus, and article manufacturing method
- Patent Title (中): 标记位置检测器,压印装置和制品制造方法
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Application No.: US12966237Application Date: 2010-12-13
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Publication No.: US08953175B2Publication Date: 2015-02-10
- Inventor: Hiroshi Sato
- Applicant: Hiroshi Sato
- Applicant Address: JP
- Assignee: Canon Kabushiki Kaisha
- Current Assignee: Canon Kabushiki Kaisha
- Current Assignee Address: JP
- Agency: Rossi, Kimms & McDowell LLP
- Priority: JP2009-285744 20091216
- Main IPC: G01B11/14
- IPC: G01B11/14 ; G01B11/02 ; G03F9/00 ; G03F7/00

Abstract:
A detector for detecting a position of a mark comprises: an image sensing device; an optical system which projects the mark onto an image sensing surface of the image sensing device; a pattern located in a position between the image sensing surface and an optical element located closest to a plane on which the mark is to be located, among optical elements forming the optical system, the position being optically conjugated with the plane; and a processor which calculates a position of the mark with respect to one of a position of the pattern and a position already known from the position of the pattern, based on a moire pattern formed on the image sensing surface by the mark and the pattern.
Public/Granted literature
- US20110141489A1 MARK POSITION DETECTOR, IMPRINT APPARATUS, AND ARTICLE MANUFACTURING METHOD Public/Granted day:2011-06-16
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