Invention Grant
- Patent Title: Nonvolatile memory device and read method thereof
- Patent Title (中): 非易失性存储器件及其读取方法
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Application No.: US13401151Application Date: 2012-02-21
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Publication No.: US08953376B2Publication Date: 2015-02-10
- Inventor: Sang-Wan Nam , Chiweon Yoon , Jung-Soo Kim
- Applicant: Sang-Wan Nam , Chiweon Yoon , Jung-Soo Kim
- Applicant Address: KR Gyeonggi-Do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-Do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2011-0019022 20110303
- Main IPC: G11C16/04
- IPC: G11C16/04 ; G11C16/06 ; G11C16/26 ; H01L27/115

Abstract:
According to example embodiments, a read method of a nonvolatile memory device includes Disclosed is a read method of a nonvolatile memory device which includes selecting one of a plurality of vertical strings in a nonvolatile memory device, judging a channel length between a common source line and a selected one of the plurality of vertical strings, selecting a sensing manner corresponding to the judged channel length, and performing a sensing operation according to the selected sensing manner. The plurality of vertical strings may extend in a direction perpendicular to a substrate of the nonvolatile memory device.
Public/Granted literature
- US20120224426A1 NONVOLATILE MEMORY DEVICE AND READ METHOD THEREOF Public/Granted day:2012-09-06
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